Product novelty 29. April 2025

Combined top & bottom topography measurement - FTP Flatness, Thickness & Parallelism

1 / 3
FTP module for combined measurement of Flatness, Thickness & Parallelism
2 / 3
FTP module for combined measurement of Flatness, Thickness & Parallelism
3 / 3
FTP module for combined measurement of Flatness, Thickness & Parallelism
Now, Polytec enhances the perspective for valid measurement results, providing a combined top & bottom topography in a single, but areal and direct measurement. The new Polytec FTP Flatness, Thickness and Parallelism measuring module represents the fast and comprehensive measurement solution for evaluating flatness, thickness and parallelism at once. The FTP measuring module for back and front measurements can become a game-changer in quality control of precision mechanics such as in the watch-making industry, for sealing surfaces, shim rings or optical components and more.

The FTP concept for combined top & bottom topography avoids flipping of the sample, provides direct instead of indirect measurement using a reference surface and last but not least, FTP increases data density.

Data density depending on line vs areal profiling
Common single-point or line-profile based evaluations can only gather a limited measurement points of the true 3D (areal) surface. This results in time-consuming procedures along with the sacrifice of either higher point density or throughput. Here, the Polytec FTP combined measurement approach provides a non-contact, high data density or areal measurements from both top and bottom view in a single measurement.